8 results
Dielectric Morphology and RRAM Resistive Switching Characteristics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1691 / 2014
- Published online by Cambridge University Press:
- 19 June 2014, mrss14-1691-bb03-03
- Print publication:
- 2014
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In Situ Investigation of Dielectric Breakdown in Field Effect Transistors
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1298-1299
- Print publication:
- July 2010
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Physical Properties of Hafnium-Silicate Transistor Gate Dielectric Stacks after Thermal Processing
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2082-2083
- Print publication:
- August 2005
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Advanced Characterization of Novel Gate Stacks for Si CMOS by Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 290-291
- Print publication:
- August 2004
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Experimental Study of Etched Back Thermal Oxide for Optimization of the Si/High-k Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 811 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, E1.4
- Print publication:
- 2004
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Effects of Structural Properties of Hf-Based Gate Stack on Transistor Performance
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- Journal:
- MRS Online Proceedings Library Archive / Volume 811 / 2004
- Published online by Cambridge University Press:
- 28 July 2011, D2.6
- Print publication:
- 2004
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Electrical and Physical Characterization of Ultrathin Silicon Oxynitride Gate Dielectric Films Formed by the Jet Vapor Deposition Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 592 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 307
- Print publication:
- 1999
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Process and Manufacturing Challenges for High-K Gate Stack Systems
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- Journal:
- MRS Online Proceedings Library Archive / Volume 567 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 323
- Print publication:
- 1999
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